Editors
Anne Allison, Duke University, United StatesLeigh Campoamor, Duke University, United States
Kevin Robert Fodness, Rensselaer Polytechnic Institute, United States
Kim Fortun, Rensselaer Polytechnic Institute, United States
Mike Fortun, Rensselaer Polytechnic Institute
Nadia Hemady
Alison Kenner, Rensselaer Polytechnic Institute, United States
Spencer Orey, Duke University, United States
Charles Daniel Piot, Duke University, United States
Section Editors
Kevin Robert Fodness, Rensselaer Polytechnic Institute, United StatesKim Fortun, Rensselaer Polytechnic Institute, United States
Mike Fortun, Rensselaer Polytechnic Institute
Alison Kenner, Rensselaer Polytechnic Institute, United States
Copyeditor
Jacki Swearingen, Rensselaer Polytechnic Institute, United StatesISSN: 1548-1360